SYSTEM CT Y.CT Compact

Perform 3D inspections efficiently

Do you need to inspect large parts with a high density? Are you looking for an efficient entry point into the benefits of industrial CT? Experience
the easy-to-use Y.CT Compact which saves time thanks to the outstanding function of defining single CT slices. Benefit from premium 3D quality
control and low testing costs per unit item. Automatic image enhancement via dedicated software algorithms significantly contributes to the premium
image quality of Y.CT Compact.

In one test run you can create CT slices with different parameters for different areas of the test parts. This way, you speed up the testing process while
maintaining image quality. Inspection time is also minimized via our multiple parts testing feature – conveniently covering more than one item per test run.

YXLON has developed a linear detector array (LDA) that further guarantees homogenous image quality and provides an unprecedented signal-to-noise ratio. Our detector calibration process helps ensure consistent image quality.

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